I would like to know the thermal history of these devices, out of the package.
The latest datasheet indicates, that the electrical parameters are tested at 25°C only, but there's Note 2, that these devices are 'QA tested at -55°C and +125°C'.
How are the LTZ1000 / LTZ1000A devices tested during manufacturing and at the final test?
Do you perform a 100% test at these extreme temperatures, or only on a limited number of samples?
Or are these extreme temperature tests avoided on manufactured parts, and done only on separate QA samples?
Background of my investigation is, that the reference chip encounters a hysteretic shift of its output voltage, when brought to extreme temperatures; i.e. a positive shift when cooled about < 0°C, and negative, when heated above 60 °C.
Thanks.
