device testing of LTZ1000 / LTZ1000A

I would like to know the thermal history of these devices, out of the package.

The latest datasheet indicates, that the electrical parameters are tested at 25°C only, but there's Note 2, that these devices are 'QA tested at -55°C and +125°C'.
How are the LTZ1000 / LTZ1000A devices tested during manufacturing and at the final test?

Do you perform a 100% test at these extreme temperatures, or only on a limited number of samples?

Or are these extreme temperature tests avoided on manufactured parts, and done only on separate QA samples?

Background of my investigation is, that the reference chip encounters a hysteretic shift of its output voltage, when brought to extreme temperatures; i.e. a positive shift when cooled about < 0°C, and negative, when heated above 60 °C.   


  • 0
    •  Analog Employees 
    on Oct 12, 2018 1:18 AM

    Hi Dr. Frank,

    Thank you for sharing your background of investigation and I see you are observing LTZ1000 output voltage thermal hysteresis shift when introduced to extreme temperatures.

    In order to assist you with LTZ1000 thermal hysteresis shift investigation, here are few questions I have:

    1) For me to understand what application is driven by LTZ1000, it would be helpful if you can please share description of system/application where LTZ1000 being used.

    2) Thermal hysteresis depends on LTZ1000 temperature set point as well as driving capability of external circuitry. It would be helpful if you can please share LTZ1000 schematic ?

    3) Thermal hysteresis data (plot) you collected ?

    4) Temperature coefficient result ?

    Thank You,