I am working on a sustained large impact detection logic. In our hardware design, the ADXL345 module talks to the micro using the I2C bus and we are using the 400Hz sampling rate.
We can measure instantaneous impacts that last only 1 or 2 samples, which equates to 2.5mSec to 5mSec. I have noticed a lot of bouncing effect in the following values as the module settles down.
I want to know if the team at Analog Devices, conducted any sustained impact testing and what did that data look like?
Also is ADXL345 capable of measuring sustained large impacts of 50mSec or more?