Are there any data on the effects of short and/or long term aging effects on accelerometer offsets after a device has been soldered to a PCB?
I'm using an ADXL346.
When we do the offset mass production test, the long term aging effect is considered. This means the +/-150mg max offset has included the life shift. Hope this can help.
I am sorry that this has not been answered. Our team is in the process of replacing a team member, who moved to another role inside of ADI, so we are struggling to make sure that all of these get the attention they deserve. In most cases, the initial bias error specifications normally include some consideration for drift, though a "typical use" profile over time. Do you have a specific performance target you are trying to hold over time? Do you have opportunity to re-calibrate in your application?
Retrieving data ...