SEE test results report and related information for AD5270BRMZ-100

Hello DivyaPV ,

Sorry for the delayed reply. Here are the answers to the above questions:

1) Is Boro Phospho Silicate Glass (BPSG) present in die? - Die is mainly silicon
2) What is the process size? - 0,6um
3) Are these parts SEE tested? - No
4) Please provide the test location and beam information. - EOL test is ASE Taiwan, no SEE test location
5) What is the test temperature environment? - EOL test ambient ~25°C
6) What is the worst case angle of incidence for applied beam? - no SEE test
7) How many units were tested for each part number? - 100% parts are tested in end of line in production, 
8) What is the applied fluence during test? - Not clear what you mean. If it is a SEE parameter, then it is N/A

Kind regards,

Stanca

Hi Stanca, Thank you for replying. On the first question, I meant if the internal semiconductor‐die uses BPSG (boro-phospho-silicate glass) for interlayer dielectric or passivation or not. I need this data for SEE analysis. Please give me details.