ADI 专家好，我这边在调试ADIS16470时遇到一个问题，ADIS16470 设为200Hz 输出，采样输出为传感器的原始数据，在桌面上进行人工手动冲击，z 轴陀螺出现冲击结束后，角速度依然有几百度每秒，且恢复不了，重新上电启动可恢复，此现象目前只发现在朝z 轴方向冲击时有，对另外两轴没有发现；能帮忙分析吗？
Can't I have data of an evaluation substrate?
When I could receive,can I use by mass production?
I find this web page.
this page Introduce ADIS16470 ADiS16495.
is this page applye to ADIS16460？
Thank you for sharing your project and progress with us on the EngineerZone?
Thank you for your interest in this product and for posting this question! I suspect that the primary issue could be a violation of the read stall time. See Table 2 and Figure 4 in the ADIS16470 datasheet and let me know what you think.
Hello! My colleague, from the team who developed the platform that you are using, offered the following inputs. I hope that this helps and look forward to your feedback.
The latest ADIS16470 ROS driver has an update about CBE.
If you are willing to develop some familiarity with the ADIS16470's operation and user interface, through the ADIS16470 datasheet, you will not need an evaluation tool, in order to calibrate the bias. I would recommend reading through the datasheet…
Here are some notes that I was able to compile, for adapting embedded C/C++ code that was written for the ADIS16470, for use with the ADIS16465. I hope that this helps.
ADI 专家好，我这边在调试ADIS16470时遇到一个问题，ADIS16470 设为200Hz 输出，采样输出为传感器的原始数据，在桌面上进行人工手动冲击，z 轴陀螺出现冲击结束后，角速度依然有几百度每秒，且恢复不了，重新上电启动可恢复，此现象目前只发现在朝z 轴方向冲击时有，对另外两轴没有发现；能帮忙分析吗