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  • +Documents
  • +AD9361: FAQ
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  • -AD936x: FAQ
    • AD936x Built in Self Test (BIST)
    • AD936x digital interface capacitive load drive in CMOS mode
    • AD936x documentation changes
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AD936x Built in Self Test (BIST)

BIST Signal Generator

AD9361 and AD9364 have an internal signal generator which can be used to inject a signal into either the output of the Tx data port or the input of the Rx data port. This is useful when testing the connectivity of the Rx data port or the Tx RF output. It is a useful tool when debugging effects in the Tx chain of the AD9361. It allows the user to rule out the Tx data port as the source of issues, as it allows the user to generate a signal and inject it at the output of the Tx data port. Please see the attached document for more details.

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AD9361BISTFAQ.pdf
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Related Content
  • RE: AD9361 Loop Test , Repeater Application
    ADIApproved
    The AD9361 has an internal signal generator which can be used to inject a signal into either the output of the Tx data port or the input of the Rx data port. This is useful when testing the connectivity...
  • RE: AD9361 Loop Test , Repeater Application
    ADIApproved
    The AD9361 has built in features that allow the user to test the data port and RF functionality of the chip. The features comprise data loopback mode, where data received through the Tx data port is fed...
  • RE: Data Port Loop Test for AD9364
    ADIApproved
    I would suggest using the internal BIST generator to perform the test first. By using the BIST generator you can test the Tx signal chain (observe Tx output on a spectrum analyzer) and observe data at...
 
Related Content
  • RE: AD9361 Loop Test , Repeater Application
    ADIApproved
    The AD9361 has an internal signal generator which can be used to inject a signal into either the output of the Tx data port or the input of the Rx data port. This is useful when testing the connectivity...
  • RE: AD9361 Loop Test , Repeater Application
    ADIApproved
    The AD9361 has built in features that allow the user to test the data port and RF functionality of the chip. The features comprise data loopback mode, where data received through the Tx data port is fed...
  • RE: Data Port Loop Test for AD9364
    ADIApproved
    I would suggest using the internal BIST generator to perform the test first. By using the BIST generator you can test the Tx signal chain (observe Tx output on a spectrum analyzer) and observe data at...
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