Is it possible to build a LUT of DPD coefficients at the [customer] factory in-circuit prior to deployment across the parameters of temperature, power-level, and frequency that could be applied open loop in the field based on those known parameters, even at some compromised performance vs. real-time DPD feedback?
If so, what guidance can you offer on the size of the LUT? - i.e.. what resolution might be acceptable for measuring those three variables?
In the application of interest, an LDMOS PA would be used at up to ~10W, the temperature range would pretty much span the gamut, but the frequency range would be low S-band, only about a 10-15% range.