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HMC4069 damaged: Short circuit between Vcc and ground.

Thread Summary

The user experienced chip damage with the HMC4069, characterized by a short circuit between VCC and ground and low impedance on other pins after six months of operation. The final answer suggests that voltage leakage during power-up may affect long-term reliability, the 2.5 s unlock duration is likely due to the external RC network or internal lock detect timing, NU and ND pin voltages should remain above 2.5 V continuously, and monitoring supply current and NU/ND voltages over time is recommended.
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Category: Hardware
Product Number: HMC4069

During the use of the HMC4069 device, two instances of chip damage have occurred. The failure symptom is a short circuit between the VCC pin and ground. Meanwhile, the impedance of other pins is an order of magnitude lower than that of a normal chip. Both damaged units failed after approximately six months of operation. I have reviewed the surrounding peripheral circuits and have the following questions:

  1. When the device is initially powered on without enabling the HMC4069, voltage leakage is observed from the control pins to the VCC and NUND pins. Will this leakage cause long-term damage to the chip?
  2. I captured the lock and unlock behavior using an oscilloscope. Why does the unlock state come with a fixed low-level duration of about 2.5 seconds?
  3. The datasheet specifies that the NUND pin voltage must not drop below 2.5 V. Does this requirement apply under specific operating conditions, or must NUND be kept above 2.5 V continuously from power-up and enablement?
  4. Are there any other potential root causes that may lead to this type of gradual chip damage after long-term operation?
Figure 1 shows the schematic of the HMC4069 and the peripheral op-amp circuit. Figure 2 displays the NUND waveform during locked status, and Figure 3 shows the NUND waveform during unlock status.
  • A1: According to the datasheet requirements, the voltage on the NU and ND pins must not fall below 2.5 V. Therefore, the leakage voltage during power-up may potentially affect the long-term reliability of the device.

    A2: This phenomenon may be related to the external RC filtering network. You may try reducing the capacitor value to see whether the 2.5 s period changes. It may also be associated with the internal lock detect state machine timing of the HMC4069, which likely updates its lock decision periodically. However, this is only a hypothesis, and the exact behavior depends on the internal implementation of the lock detection mechanism.

    A3: It is recommended that the NU and ND pin voltages remain above 2.5 V throughout the entire operating period.

    A4: It is suggested to monitor whether the supply current changes over long-term operation, and whether the NU and ND voltages remain above 2.5 V continuously. At present, no other obvious potential root causes have been identified.

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