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Enquire on ADAR devices

Dear Sir/Madam,

I have checked the wafer fabrication and it state BiCMOS.

I would like to find out the if ADAR1000 and ADAR3000 are based on SiGe HBT BiCMOS or SOI fabrication?

I notice ADAR300 is consider space grade part, is there SEE ( SEL, SEU) and TID data?

Able to share the ESD (HBM n CDM)

Tks

Regards,

Nick

Parents
  • Here is the radiation testing that was performed on ADAR3000. If you need more details on this part, including the complete datasheets, please contact your local ADI sales team in Singapore. - Eamon

    Total ionizing dose (TID) testing characterized to 45 krads (30 krads + 50% overstress) with biased annealing at 100°C for 168 hours. Once characterized, TID testing performed to 30 krads only.

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  • Here is the radiation testing that was performed on ADAR3000. If you need more details on this part, including the complete datasheets, please contact your local ADI sales team in Singapore. - Eamon

    Total ionizing dose (TID) testing characterized to 45 krads (30 krads + 50% overstress) with biased annealing at 100°C for 168 hours. Once characterized, TID testing performed to 30 krads only.

Children