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[Critical Issue] LTC7804 100% Failure Rate: INTVCC LDO Collapse & Instability

Thread Summary

The user is experiencing 100% chip failure with the LTC7804 in a synchronous boost configuration (15V to 24V, 375kHz) due to INTVCC voltage collapse and spikes during switching, even with extensive protection circuits and capacitor upgrades. The issue persists with different MOSFETs and an external 5V supply, suggesting a potential problem with the chip's internal LDO or layout sensitivity. The user has tested the same MOSFETs on the evaluation board without issues, indicating the problem may be specific to the chip package or internal LDO design. The user is preparing to switch to the LTC3769 or a competitor's product.
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Category: Hardware
Product Number: LTC7804

I am experiencing a critical stability issue with the LTC7804 in a synchronous boost configuration (15V to 24V), resulting in a 100% chip failure rate during testing.

Despite following standard design practices and implementing extensive protection circuits, the internal LDO (INTVCC) fails to maintain regulation when driving modern, high-performance MOSFETs, leading to catastrophic failure of the controller.

1. System Configuration:

  • Topology: Synchronous Boost (VIN=15V,VOUT=24V,FSW=375kHzVIN=15V,VOUT=24V,FSW=375kHz).

  • MOSFETs: Originally Infineon IAUZN04S7N026, switched to Vishay SiR662DP and BSC032N04LS which is used in Demo board.

  • Protection Added:

    • External Schottky (B140) on SW node to GND (clamping negative voltage).

    • High-voltage Bootstrap Diode (NSV1SS400, 100V rating).

    • Bootstrap Resistor (RBOOT) tested from  to 10Ω.

2. The Problem: INTVCC Instability
When the device attempts to switch (even under light load of 20mA in Pulse-Skipping mode), the INTVCC voltage collapses significantly, often dropping below the UVLO threshold (<3.3V) and then rebounding with a massive spike (>7V), exceeding the Absolute Maximum Rating (6V).

3. Debugging & Mitigation Attempts (All Failed):
We have isolated the issue to the internal LDO's inability to handle the transient current requirements of the MOSFETs (Qg≈35nCQg35nC), combined with extreme sensitivity to layout parasitics.

  • Capacitor Upgrades: We increased the INTVCC capacitance from 4.7uF up to 47uF, and even tried stacking ceramic capacitors directly on Pin 12 and Pin 17 to minimize ESL. The voltage dip persists.

  • Bootstrap Resistor: Adding a 3.3Ω to 10Ω series resistor smoothed the charging peak but caused the High-Side drive voltage to sag (staircase drop) due to insufficient charging time during burst mode.

  • Isolation Test (Async Mode): We disconnected the TG pin and shorted the Top FET Gate-Source (forcing asynchronous operation). 

  • Result: INTVCC still collapses significantly just by driving the Bottom FET (BG).

  • External Supply Test: We disabled the internal LDO and supplied 5V externally to the EXTVCC pin. 

  • Result: Even with an external bench supply, we observed a voltage drop to ~4.0V at the pin during switching, indicating high internal impedance or path resistance.

4. Conclusion:
It appears the LTC7804's internal LDO and power distribution architecture are too weak to drive MOSFETs , or the chip has zero margin for layout parasitic inductance, leading to immediate destruction of the LDO block (INTVCC measures 17Ω

 to GND after failure).

Note on Support History:
I was previously working with an ADI application engineer on this specific case. However, I have been informed that he has left the company, and unfortunately, he left without providing any constructive solution or root cause analysis.

I urgently need a senior engineer to review this case. Is the LTC7804 simply incompatible with this class of MOSFETs, or is there a known design flaw regarding the LDO's transient response?

  • Was your problem caused under the condition of the circuit being loaded? Was the system stable during the no-load test?
    Have you ever tried testing your application scenario and parameters on our evaluation board?
    What specific phenomena occur after a chip failure? INTVCC pin short circuit?
    You can contact our technical support center at: 支持 | Analog Devices.  You can send us your clear SCH, and there will be dedicated engineers who will provide you with one-on-one technical support.

  • Hi Iauren, thanks for the response. Here are the clarifications regarding your questions:

    1. Load Conditions:
    The system is stable during absolute no-load (idle state). The failure is triggered immediately upon applying a 20mA light load. The moment switching begins, the INTVCC rail collapses, leading to chip destruction.

    2. Evaluation Board (EVB) & MOSFET Verification (Critical Info):
    The EVB works fine, but there are two major distinctions:

    • Different Package: The LTC7804 used on the EVB is a different package compared to the one in my design. (I do believe that should not be root cause of issue, but I have nothing to be considered)

    • MOSFET Verification: I have not only tested the SiR662DP but I have also swapped in the exact same MOSFET used on the EVB (BSC032N04LS) onto my board.
      The result is the same: the chip still fails and INTVCC collapses.
      This test conclusively rules out the MOSFET selection (Gate Charge) as the root cause. Since the same MOSFET works on the EVB but fails on my board with this specific LTC7804 package, it strongly suggests a potential issue with the chip itself or its internal LDO design.

    3. Failure Phenomena:
    After failure, the INTVCC pin measures a low resistive short (~17Ω) to GND. This confirms the internal LDO is being destroyed.

    4. Regarding Layout:
    I will submit the SCH/Layout again, but please note that my Layout has already been reviewed by the previous ADI Application Engineer who was handling this case before he left. He did not find any critical issues with the layout.

    I'm extremely disappointed with this 7804 and am preparing to switch to the previous 3769 or competitor's products.