Locale Icon
English
  • Forums

    Popular Forums

    • LTspice
    • Video
    • Power Management
    • RF & Microwave
    • Precision ADCs
    • FPGA Reference Designs

    Product Forums

    • Amplifiers
    • Clocks & Timers
    • Data Converters
    • Direct Digital Synthesis (DDS)
    • Energy
    • Interface and Isolation
    • MEMS Inertial Sensors
    • Power Management
    • Processors & DSP
    • Processors & Microcontrollers
    • Switches & Multiplexers
    • Sensors
    • Voltage References
    View All

    Application Forums

    • A2B Audio Bus
    • Audio
    • Automated Test Equipment (ATE)
    • Condition-Based Monitoring
    • Depth, Perception & Ranging Technologies
    • Embedded Vision Sensing Library
    • Motor Control Hardware Platforms
    • Precision Technology Signal Chains Library
    • Video
    • Wireless Sensor Networks Reference Library

    Design Center Forums

    • ACE Evaluation Software
    • ADEF System Platforms
    • Design Tools & Calculators
    • FPGA Reference Designs
    • Linux Software Drivers
    • Microcontroller no-OS Drivers
    • Power Studio Designer
    • Power Studio Planner
    • Reference Designs
    • Robot Operating System (ROS) SDK
    • Signal Chain Power (SCP)
    • Software Interface Tools
    • System Demonstration Platform (SDP) Support
  • Learn

    Highlighted Webinar

    Power Management Fundamentals II Session 6: Key Layout Considerations for Power

    Understand the physics of printed circuit boards to manage large changes in current or voltage. See how layout tweaks can make big improvements for your...

    Places

    • ADI Academy
    • ADI Webinars
    • Video Annex
    • Virtual Classroom

    Libraries

    • 3D ToF Depth Sensing Library
    • Continuous-Wave CMOS Time of Flight (TOF) Library
    • Embedded Vision Sensing Library
    • Gigabit Multimedia Serial Link (GMSL) Library
    • Optical Sensing Library
    • Precision Technology Signal Chains Library
    • Software Modules and SDKs Library
    • Supervisory Circuits Library
    • Wireless Sensor Networks Library

    Latest Webinars

    • Enabling New Space Missions: Commercial Space Screening Approach for Agile, High-Reliability Payloads
    • Understanding and Selecting RF Low Noise Amplifiers for Instrumentation, Phased Array and General Purpose Applications
    • Design Smarter with Compact, Low-Power Precision Current Source Signal Chains
    • Power Management Fundamentals II Session 6: Key Layout Considerations for Power
    • A 16T/16R X-Band Direct Sampling Phased Array Subsystem using Apollo MxFE
    View All Webinars
  • Community Hub

    Challenge Yourself!

      KCC's Quizzes AQQ296 about repairing an equation in a digital display

      1. Quote of this month: " When I die, I want to die like my grandfather who died peacefully in his sleep. Not screaming like all the passengers in his...

    View All

    What's Brewing

      Read a Blog, Take this Quiz for Another Chance to Win a Gift Card!

      Important: Read the blog first . The quiz questions are all based on the content from the blog: Mature, Not Old! The Longevity of 4 – 20 mA New...

    View All

    Places

    • Community Help
    • Analog Dialogue Quiz
    • Logic Lounge
    • Super User Program

    Resources

    • EZ Code of Conduct
    • EZ How To Help Articles
    • Getting Started Guide
    • ADI: Words Matter
    • Community Help Videos
    View All
  • Blogs

    Highlighted Blogs

    Taming the Chaos: Correlated and Uncorrelated Sources in LTspice .NOISE Simulations: Part 3 of 3

    Noise analysis of a circuit requires tracking several things simultaneously: each noise source, how those noise sources are shaped by the circuit, and...

     

    ​​Where Errors Lurk in the GMSL Signal Chain​

    Whether you're debugging a stubborn camera link or designing a robust system from scratch, knowing where errors hide is half the battle. GMSL provides...

    Latest Blogs

    • Achieving Power Over Data with RS-485 Transceivers
    • ​​Functional Safety: A Driver of “Shift Left”​
    • The 5 Advantages of Hardware Fault Tolerance
    • The Power Problem Inside Every AI Breakthrough: Part 1 of 3
    • Simplifying Stability with EVAL-KW4503Z: Part 1 of 3
    Read All Blogs

    ADI Blogs

    • EZ Spotlight
    • The Engineering Mind
  • ContentZone

    Visit ContentZone

    ContentZone

    Technical articles. Blogs. Videos. Your ADI content, all in one place.

    View ContentZone

    Featured Content

    Featured Content Title

    Blurb About Content

    View Content By Industry

    • Aerospace and Defense Systems
    • Automotive Solutions
    • Consumer Technology Solutions
    • Data Center Solutions
    • Energy Solutions
    • Healthcare Solutions
    • Industrial Automation Technology Solutions
    • Instrumentation and Measurement Solutions
    • Intelligent Building Solutions
    • Wireless Communication Solutions

    View Content By Technology

    • A2B Audio Bus
    • ADI OtoSense Predictive Maintenance Solutions
    • Dynamic Speaker Management
    • Gallium Nitride (GaN) Technology
    • Gigabit Multimedia Serial Link (GMSL)
    • Industrial Vision
    • Power Solutions
    • Precision Technology
    • RF
    • Sensor Interfaces
    • SmartMesh
EngineerZone
EngineerZone
MEMS Inertial Sensors
  • Log In
  • User
  • Site
  • Search
OR
Ask a Question
MEMS Inertial Sensors
MEMS Inertial Sensors
Documents Gyroscope In-Run Bias Stability
  • Forums
  • Files
  • FAQs/ Docs
  • Members
  • Tags
  • Cancel
  • +Documents
  • +3-D Model/STEP: FAQ
  • +AD22282-A-R2: FAQ
  • +ADIS16000: FAQ
  • +ADIS16003 MTBF: FAQ
  • +ADIS16006: FAQ
  • +ADIS16201: FAQ
  • +ADIS16203: FAQ
  • +ADIS16204: FAQ
  • +ADIS16209: FAQ
  • +ADIS16210: FAQ
  • +ADIS16223: FAQ
  • +ADIS16227: FAQ
  • +ADIS16228: FAQ
  • +ADIS16229: FAQ
  • +ADIS16240: FAQ
  • +ADIS16255: FAQ
  • +ADIS16355: FAQ
  • +ADIS16364: FAQ
  • +ADIS16365: FAQ
  • +ADIS16375: FAQ
  • +ADIS16385: FAQ
  • +ADIS16400: FAQ
  • +ADIS16405: FAQ
  • +ADIS16407: FAQ
  • +ADIS16445: FAQ
  • +ADIS16448: FAQ
  • +ADIS16460: FAQ
  • +ADIS16475: FAQ
  • +ADIS16477: FAQ
  • +ADIS1647x: FAQ
  • +ADIS16480: FAQ
  • +ADISUSB: FAQ
  • +ADXL001: FAQ
  • +ADXL203: FAQ
  • +ADIS16300: FAQ
  • +ADIS16485: FAQ
  • +ADIS16488: FAQ
  • +ADIS16488A: FAQ
  • +ADIS16490: FAQ
  • +ADIS16495: FAQ
  • +ADIS16497: FAQ
  • +ADXL103: FAQ
  • +ADXL150: FAQ
  • +ADxL193: FAQ
  • +ADXL202: FAQ
  • +ADXL206: FAQ
  • +ADXL210: FAQ
  • +ADXL210E: FAQ
  • +ADXL213: FAQ
  • +ADxL230: FAQ
  • +ADXL278: FAQ
  • +ADXL312: FAQ
  • +ADXL313: FAQ
  • +ADXL320: FAQ
  • +ADXL321: FAQ
  • +ADXL322: FAQ
  • +ADXL327: FAQ
  • +ADXL335: FAQ
  • +ADXL337: FAQ
  • +ADXL345: FAQ
  • +AD22290: FAQ
  • +ADIS16003: FAQ
  • +ADIS16133: FAQ
  • +ADIS16135: FAQ
  • +ADIS16265: FAQ
  • +ADIS16305: FAQ
  • +ADXL326: FAQ
  • +ADXL350: FAQ
  • +ADXL362: FAQ
  • +ADXL375: FAQ
  • +ADXL377: FAQ
  • +ADXL78: FAQ
  • +ADXRS150: FAQ
  • +ADXRS290: FAQ
  • +ADXRS300: FAQ
  • +ADXRS401: FAQ
  • +ADXRS453: FAQ
  • +ADXRS610: FAQ
  • +ADxRS614: FAQ
  • +ADXRS623: FAQ
  • +ADXRS646: FAQ
  • +ADXRS652: FAQ
  • +ADXRS800: FAQ
  • +ADIS16136: FAQ
  • +ADIS16137: FAQ
  • +ADIS16266: FAQ
  • +ADIS16334: FAQ
  • +ADIS16362 Evaluation Tool: FAQ
  • +ADIS16364 Evaluation Tool: FAQ
  • +ADIS16367: FAQ
  • +ADIS163xx: FAQ
  • +ADIS16489: FAQ
  • +ADIS1648x: FAQ
  • +ADXL346: FAQ
  • +ADXL363: FAQ
  • +EVAL-ADIS: FAQ
  • +EVAL-ADIS2: FAQ
  • +Filtering Functions: FAQ
  • +General: FAQ
  • -Gyroscope: FAQ
    • Gyroscope Angle Random Walk
    • Gyroscope In-Run Bias Stability
    • Gyroscope Noise Density
    • +Gyroscope Sensitivity/Scale Factor Evaluation
    • Simple Gyroscope Calibration
    • Repeatable Gyroscope Bias from Part to Part
  • +Hard & Soft Iron Correction: FAQ
  • +ISEB USB: FAQ
  • +IMU: FAQ
  • +MEMS: FAQ
  • +Slip Ring Interface: FAQ
  • +SPI Troubleshooting: FAQ
  • +TEMP_OUT Variation: FAQ
  • +Test Procedures: FAQ
  • +AD590: FAQ
  • +AD5940: FAQ
  • +AD5941: FAQ
  • +AD8495: FAQ
  • +AD8497: FAQ
  • +ADUCM355: FAQ
  • +ADXL343: FAQ
  • +ADXL357: FAQ
  • +ADXL367: FAQ
  • +CN0429: FAQ
  • DS1922E: FAQ
  • +DS1922L: FAQ
  • +DS1922T: FAQ
  • +DS1923: FAQ
  • +EVAL-ADXL312-SDP: FAQ
  • +MAX30001: FAQ
  • +MAX30003: FAQ
  • +MAX30003CTI+: FAQ
  • +MAX30003WING: FAQ
  • +MAX30009EVKIT: FAQ
  • +MAX30134EVSYS: FAQ
  • +MAX9621: FAQ
  • +TMP01: FAQ

Gyroscope In-Run Bias Stability

Q:

How do I measure in-run bias stability in a MEMS gyroscope?

-----------------------------------------------------------------------------------------------------------

A:

The "in-run bias stability" typically references the minima of the Allan Variance curve. The Allan Variance method was developed by David Allan, in the 1960s, for the purpose of monitoring stability in atomic clocks, but the method works very well for studying gyroscope bias as well. IEEE-STD-952-1997, Appendix B, provides a lot of detailed information on this method, but the purpose of this FAQ is to focus on how to apply this method, using a specific example.  Let's start with the ADIS16485, a 6DOF IMU that provides an Allan Variance plot in its datasheet. The integration time for the Allan Variance minima covers a span of ~40 to 2000 seconds.

TOOLS

This example uses (1) ADIS16485AMLZ, (1) EVAL-ADIS, the IMU Evaluation software package (1.1) and a vice for keeping the IMU stable during data collection.  The EVAL-ADIS User Guide, UG-287, provides details on how to set the EVAL-ADIS and IMU Evaluation software package for ADIS16485 testing.

SETUP

  1. Set the ADIS16485 up for a decimation rate of 1230, which results in an output data rate of 2 samples per second.  In the IMU Evaluation software package, click on "Register Access," select "DEC_RATE," enter "4CD" in the white entry box, then hit "Write."  Note that DEC_RATE = 0x04CD establishes the decimation rate of 1230.
  2. Set up the Data Capture, with the following settings:
    • Un-scaled data (personal preference)
    • 20 minutes of data collection (30 time segments, at 40 seconds each)
    • Filename/location (personal preference)
  3. Make sure that the DUT (ADIS16485) cannot move during the data capture process. In this experiment, the DUT was placed in a small vice and placed on top of a desk.

DATA CAPTURE

Hit the start button and wait for the data collection process to complete. The Data Capture menu will provide a real-time status update at the bottom of the screen. The following picture show this, along with the Data Capture settings for this test. Click on the image to access a higher-resolution version.

DATA ANALYSIS

Once the analysis is complete, open the data file in MS Excel to complete the analysis. Obviously, there are more elegant ways to process this data, for those who can write macros or their own analysis programs, but the attached Excel file (ADIS16485_IRBS_DataAnalysis.xlsx), provides a manual analysis view, for the purpose of learning each step.

  1. Convert the un-scaled, twos complement data into a decimal equivalent (Column C)
  2. Apply the scale factory convert the data into units of degrees/second (Column D)
  3. Produce the average value for 30 "integration time periods," which represent 40 seconds. (Column F)
  4. Apply the Allan Variance equation to the set of average values (Cell H38, H39)

DISCUSSION

The attached Excel file has two separate sheets in it.

  • Trial1-40sec shows a result of 7.6 deg/hour.
  • Trial2-40sec represents data from a second test, where the vice was moved from the desk to the floor, which has thin carpet on a cement slab. The in-run bias stability result from this test was 5.3 deg/hour.  Remember, you won't be able to see the vibration that can influence this result.

The bottom line is that this process may take some "trial and error," in order to manage all potential influences. We look forward to your feedback.

Attachments:
ez.analog.com/.../ADIS16485_5F00_IRBS_5F00_DataAnalysis.xlsx
Tags: allan_variance adis16133 sensors adis16480 in_run_bias_stability Inertial Measurement Units (IMU) adis16136 gyroscope adis16488 adis16485 imu adis16375 adis16448 adis16135 adis16488a adis16137 productpage adis16334 adis16445 Show More
  • Share
  • History
  • More
  • Cancel
 
Related Content
  • Gyroscope Angle Random Walk
    stephenv
    Q: How do I measure angle random walk in a MEMS gyroscope? ---------------------------------------------------------------------------------- A. Angle Random Walk (ARW) can be derived from the...
  • Gyroscope Sensitivity/Scale Factor Evaluation
    stephenv
    Q: Is there a simple way to test the sensitivity (scale factor) in the ADIS16485's gyroscope, using the IMU Evaluation software? -------------------------------------------------------------------...
  • Gyroscope Noise Density
    stephenv
    Q: How do I measure noise density in a gyroscope? ----------------------------------------------------------------- A: Noise Density provides a useful metric for understanding the trade-off between...
 
Related Content
  • Gyroscope Angle Random Walk
    stephenv
    Q: How do I measure angle random walk in a MEMS gyroscope? ---------------------------------------------------------------------------------- A. Angle Random Walk (ARW) can be derived from the...
  • Gyroscope Sensitivity/Scale Factor Evaluation
    stephenv
    Q: Is there a simple way to test the sensitivity (scale factor) in the ADIS16485's gyroscope, using the IMU Evaluation software? -------------------------------------------------------------------...
  • Gyroscope Noise Density
    stephenv
    Q: How do I measure noise density in a gyroscope? ----------------------------------------------------------------- A: Noise Density provides a useful metric for understanding the trade-off between...
analog-devices logo

About Analog Devices

  • Who We Are
  • Careers
  • Newsroom
  • What We Do (Signals+)
  • Investor RelationsExternalLink
  • Quality & Reliability
  • Sales and Distribution
  • What's New on Analog.com
  • Contact Us

Find Help

  • Support
  • Resources
  • WikiExternalLink
  • Analog Dialogue
  • ADI Developer PortalExternalLink

myAnalog

Interested in the latest news and articles about ADI products, design tools, training, and events?

Go to myAnalog
  • Instagram page
  • Twitter page
  • Linkedin page
  • Youtube page
  • Facebook
  • Legal and Risk
  • Accessibility
  • Privacy Policy
  • Privacy Settings
  • Cookie Settings

©2026 Analog Devices, Inc. All Rights Reserved

analog-devices

About Analog Devices

Down Up
  • Who We Are
  • Careers
  • Newsroom
  • What We Do (Signals+)
  • Investor RelationsExternalLink
  • Quality & Reliability
  • Sales and Distribution
  • What's New on Analog.com
  • Contact Us

Find Help

Down Up
  • Support
  • Resources
  • WikiExternalLink
  • Analog Dialogue
  • ADI Developer PortalExternalLink

myAnalog

Interested in the latest news and articles about ADI products, design tools, training, and events?

Go to myAnalog
Instagram page Facebook Twitter page Linkedin page Youtube page
  • Legal and Risk
  • Accessibility
  • Privacy Policy
  • Privacy Settings
  • Cookie Settings

©2026 Analog Devices, Inc. All Rights Reserved