groupUrl: https://ez.analog.com/mems/
Analog.com Analog Dialogue Wiki English
Analog.com Analog Dialogue Wiki 简体中文
EngineerZone
EngineerZone
  • Site
  • User
  • Site
  • Search
  • User
EngineerZone
EngineerZone
  • Log in
  • Site
  • Search
  • Log in
  • Home
  • Blogs ⌵
    • EZ Spotlight
    • The Engineering Mind
  • Browse ⌵
    • All Groups
    • All Members
  • Support ⌵
    • 3D ToF Depth Sensing
    • A2B
    • Aerospace and Defense (ADEF)
    • Amplifiers
    • Analog Microcontrollers
    • Analysis Control Evaluation (ACE) Software
    • Audio
    • Clock and Timing
    • Condition-Based Monitoring
    • Data Converters
    • Design Tools and Calculators
    • Direct Digital Synthesis (DDS)
    • Embedded Vision Sensing
    • Energy Monitoring and Metering
    • FPGA Reference Designs
    • Industrial Ethernet
    • Interface and Isolation
    • Low Power RF Transceivers
    • MEMS Inertial Sensors
    • Motor Control Hardware Platforms
    • Optical Sensing
    • Power Management
    • Precision Technology Signal Chains
    • Processors and DSP
    • Reference Designs
    • RF and Microwave
    • Signal Chain Power (SCP)
    • Switches/Multiplexers
    • Temperature Sensors
    • Video
    • Wide Band RF Transceivers
    • Wireless Sensor Networks Reference Library
  • About EZ
  • More
  • Cancel
  • 主页
  • 浏览 ⌵
    • 收件箱
    • 个人设置
    • 会员
    • 专区列表
  • 论坛专区 ⌵
    • 放大器专区
    • 精密转换器专区
    • 音频专区
    • ADE电能计量专区
    • MEMS和传感器专区
    • 接口和隔离专区
    • Power 中文专区
    • ADUC微处理器专区
    • 锁相环专区
    • 开关和多路复用器专区
    • 温度传感器
    • 基准电压源专区
    • 资源库
    • 论坛使用指南
    • 技术支持参考库
    • 在线研讨会
    • 论坛社群活动
    • 论坛激励活动
  • More
  • Cancel
MEMS Inertial Sensors
MEMS Inertial Sensors
Documents FAQ: ADIS16209 Self-Test Management
  • Q&A
  • Discussions
  • Documents
  • File Uploads
  • Video/Images
  • Tags
  • Managers
  • More
  • Cancel
  • New
MEMS Inertial Sensors requires membership for participation - click to join
  • +Documents
  • +3-D Model/STEP: FAQ
  • +AD22282-A-R2: FAQ
  • +ADIS16000: FAQ
  • +ADIS16003 MTBF: FAQ
  • +ADIS16006: FAQ
  • +ADIS16201: FAQ
  • +ADIS16203: FAQ
  • +ADIS16204: FAQ
  • -ADIS16209: FAQ
    • FAQ: ADIS162xx LGA Assembly Guidelines
    • FAQ: ADIS16209 Evaluation Tool Overview
    • FAQ: ADIS16209 Self-Test Management
    • FAQ: ADIS16209/ADIS16265 Lead Integrity
    • FAQ: ADIS16209/ADIS16265 Pb-free Assembly Tips
    • FAQ: ADIS1620x/21x/22x Power Regulator Suggestion
    • FAQ: ADIS1620x/21x/22x Power Supply Considersations
    • FAQ: Tilt Angle Window Detector
    • FAQ: Tilt Angle Window Detector with Evaluation Tools
    • Bias Stability over 1 Year
    • IMU Evaluation Software Bug: ADIS16209 Data Capture
    • The direction of axis X and axis Y
    • ADIS16201 and ADIS16209 Pins 8 and 10 Grounded - Performance Issues
    • ADIS16209 Datasheet Error: Address code length
    • ADIS16209 Datasheet Error; SPI Address Code Missing MSB
    • ADIS16209 Datecode Revision Change
    • ADIS16209 self-test
    • ADIS16209: How do I connect pins 7,8,10,11? There are contradictions in datasheet.
    • ADIS16209: Stability and sensitivity
    • ADIS1620x Evaluation Board dimensions
  • +ADIS16210: FAQ
  • +ADIS16223: FAQ
  • +ADIS16227: FAQ
  • +ADIS16228: FAQ
  • +ADIS16229: FAQ
  • +ADIS16240: FAQ
  • +ADIS16255: FAQ
  • +ADIS16355: FAQ
  • +ADIS16364: FAQ
  • +ADIS16365: FAQ
  • +ADIS16375: FAQ
  • +ADIS16385: FAQ
  • +ADIS16400: FAQ
  • +ADIS16405: FAQ
  • +ADIS16407: FAQ
  • +ADIS16445: FAQ
  • +ADIS16448: FAQ
  • +ADIS16460: FAQ
  • +ADIS16475: FAQ
  • +ADIS16477: FAQ
  • +ADIS1647x: FAQ
  • +ADIS16480: FAQ
  • +ADISUSB: FAQ
  • +ADXL001: FAQ
  • +ADXL203: FAQ
  • +ADIS16300: FAQ
  • +ADIS16485: FAQ
  • +ADIS16488: FAQ
  • +ADIS16488A: FAQ
  • +ADIS16490: FAQ
  • +ADIS16495: FAQ
  • +ADIS16497: FAQ
  • +ADXL103: FAQ
  • +ADXL150: FAQ
  • +ADxL193: FAQ
  • +ADXL202: FAQ
  • +ADXL206: FAQ
  • +ADXL210: FAQ
  • +ADXL210E: FAQ
  • +ADXL213: FAQ
  • +ADxL230: FAQ
  • +ADXL278: FAQ
  • +ADXL312: FAQ
  • +ADXL313: FAQ
  • +ADXL320: FAQ
  • +ADXL321: FAQ
  • +ADXL322: FAQ
  • +ADXL327: FAQ
  • +ADXL335: FAQ
  • +ADXL337: FAQ
  • +ADXL345: FAQ
  • +AD22290: FAQ
  • +ADIS16003: FAQ
  • +ADIS16133: FAQ
  • +ADIS16135: FAQ
  • +ADIS16265: FAQ
  • +ADIS16305: FAQ
  • +ADXL326: FAQ
  • +ADXL350: FAQ
  • +ADXL362: FAQ
  • +ADXL375: FAQ
  • +ADXL377: FAQ
  • +ADXL78: FAQ
  • +ADXRS150: FAQ
  • +ADXRS290: FAQ
  • +ADXRS300: FAQ
  • +ADXRS401: FAQ
  • +ADXRS453: FAQ
  • +ADXRS610: FAQ
  • +ADxRS614: FAQ
  • +ADXRS623: FAQ
  • +ADXRS646: FAQ
  • +ADXRS652: FAQ
  • +ADXRS800: FAQ
  • +ADIS16136: FAQ
  • +ADIS16137: FAQ
  • +ADIS16266: FAQ
  • +ADIS16334: FAQ
  • +ADIS16362 Evaluation Tool: FAQ
  • +ADIS16364 Evaluation Tool: FAQ
  • +ADIS16367: FAQ
  • +ADIS163xx: FAQ
  • +ADIS16489: FAQ
  • +ADIS1648x: FAQ
  • +ADXL346: FAQ
  • +ADXL363: FAQ
  • +EVAL-ADIS: FAQ
  • +EVAL-ADIS2: FAQ
  • +Filtering Functions: FAQ
  • +General: FAQ
  • +Gyroscope: FAQ
  • +Hard & Soft Iron Correction: FAQ
  • +ISEB USB: FAQ
  • +IMU: FAQ
  • +MEMS: FAQ
  • +Slip Ring Interface: FAQ
  • +SPI Troubleshooting: FAQ
  • +TEMP_OUT Variation: FAQ
  • +Test Procedures: FAQ

You are currently reviewing an older revision of this page.

  • History View current version

FAQ: ADIS16209 Self-Test Management

Q:

When my ADIS16209 starts up, STATUS = 0x0020, which indicates a self-test failure, but the rest of the operation seems to be fine. Is this real? What should I do?

----------------------------------------------------------------------------------------------------------------------------------

A:

At the time of this post, the ADIS16209 datasheet (Rev C) contains some errors in this description, which are being addressed in an upcoming revision.  In advance of this, update let's use this discussion to describe the self-test function correctly, for those who are having similar experiences. The self-test function applies an electrostatic force to the MEMS structure, inside of the core sensor, which causes the structure to move in a manner that simulates its response to gravity or linear acceleration. This provides an observable response in the accelerometer outputs, that can serve as a validation of “functional operation” throughout the entire signal chain. The MSC_CTRL register provides two different options for using this function: manual (user-command) and automatic (during start-up/reset recovery).

The manual self-test control is an on/off control for the electrostatic force.  Set MSC_CTRL[8] = 1 to turn it on and set MSC_CTRL[8] = 0 to turn it off.  For normal operation, this will be in the "off" state but this control bit provides an opportunity to activate it at anytime, so that system processors can apply application-relevant pass/fail criteria to the responses. When MSC_CTRL[10] = 1, the automatic self-test process runs the ADIS16209 through on/off states, while observing the difference in accelerometer response, between "self-test on"and "self-test off." This process concludes with a comparison of the differential response in each accelerometer, with internal pass/fail limits and a report of the result to STATUS[5].  Once the ADIS16209 completes is its start-up process, STATUS is available for a SPI-driven read, using DIN = 0x3C00 as the SPI input command (STATUS at address 0x3C).  Linear motion during the start-up process, VDD ramp rates/waveform and the tilt of the device can introduce uncertainty into the on/off levels and in some cases, cause a "false failure" report to STATUS[5] (0x0020).  While the selection of the pass/fail limits incorporates most conditions, we have seen a few cases of false failures and the recent updates for improving ADIS16209 sensitivity to power supply configuration seem to have increased this sensitivity a small amount. 

When presented with a self-test failure indication, where STATUS > 0x0020, use the following process to manually check for basic function in the ADIS16209:

  1. Starting assumptions:
    • No linear motion
    • Stable VDD
  2. Set AVG_CNT = 0x0000 and SMPL_PRD = 0x0008, in order to optimize the response times during the self-test transitions, while keeping the ADIS16209 in low power mode. In this configuration, the self-test response will be similar to a step response of a single-pole, low-pass filter that has a cutoff frequency of 50Hz. 
  3. Read XACCL_OUT and YACCL_OUT
  4. Set MSC_CTRL[8] = 1
  5. Delay > 20ms, which provides the 50Hz filter (internal to ADIS16209) with at least ~ 6 time constants to settle.
  6. Read XACCL_OUT and YACCL_OUT
  7. Calculate difference in measurements:
    • D-XACCL_OUT = XACCL_OUT (step 6) - XACCL_OUT (step 3)
    • D-YACCL_OUT = YACCL_OUT (step 6) - YACCL_OUT (step 3)
  8. Set MSC_CTRL[8] = 0
  9. Restore SMPL_PRD and AVG_CNT registers to their operational values
  10. Determine "normal operation" by make sure that the D-XACCL_OUT and D-YACCL_OUT produced a change of at least 350LSB. 
    NOTE: 350 LSB is approximately one-half of the datasheet specification for the "minimum" response time but is well above the noise floor.  Since this test is designed to find major issues, like "no response," this should be a safe approach for pass/fail criteria. 

Let me know how this works and please feel free to post any questions you have.

Best regards,

NevadaMark

 
社交网络
快速链接
  • 关于ADI
  • Partners
  • 模拟对话
  • 职业
  • 联系我们
  • 投资信息
  • 新闻中心
  • 质量和可靠性
  • 办事处与代理商
  • Analog Garage
语言
  • English
  • 简体中文
  • 日本語
  • Руccкий
电子快讯

欲获得最新ADI产品、设计工具、培训与活动的相关新闻与文章,请从我们的在线快讯中选出您感兴趣的产品类别,每月或每季度都会发送至您的收件箱。

订阅
Switch to mobile view
Analog Logo
© 1995 - 2022 Analog Devices, Inc. All Rights Reserved 沪ICP备09046653号-1
  • ©
  • 1995 - 2022 Analog Devices, Inc. All Rights Reserved
  • 沪ICP备09046653号-1
  • 网站地图
  • 隐私和保密政策
  • 隐私设置
  • 使用条款
 
Social
Quick Links
  • About ADI
  • Partners
  • Analog Dialogue
  • Careers
  • Contact us
  • Investor Relations
  • News Room
  • Quality & Reliability
  • Sales & Distribution
  • Analog Garage
Languages
  • English
  • 简体中文
  • 日本語
  • Руccкий
Newsletters

Interested in the latest news and articles about ADI products, design tools, training and events? Choose from one of our 12 newsletters that match your product area of interest, delivered monthly or quarterly to your inbox.

Sign Up
Switch to mobile view
Analog Logo
© 1995 - 2022 Analog Devices, Inc. All Rights Reserved 沪ICP备09046653号-1
  • ©
  • 1995 - 2022 Analog Devices, Inc. All Rights Reserved
  • 沪ICP备09046653号-1
  • Sitemap
  • Privacy & Security
  • Privacy Settings
  • Terms of use
EngineerZone Uses cookies to ensure you get the best experience in our community. For more information on cookies, please read our Privacy & Security Statement.