ADIS16223 Rev0 Data sheet typos?

Logic

The logic is taking the GLOB_CMD DINs that are mentioned in various places on the data sheet and finding the rule/logic that matches them to the bit positions. Your table above shows the logic between bit positions and DIN commands. The typos on the Data Sheet made it hard to find the rule / logic to match positions to DIN Commands. Your table does this well and makes it much easier for developers to follow.

GLOB_CMD[1] and GLOB_CMD[2] bits and DINs

The data sheets says “Set GLOB_CMD[2] = 1 (DIN = 0xBE02) to run an automatic self-test routine”. My observation was:

“The DIN should be 0xBE04 not 0xBE02 ?”

This was to fit in with table 27 and assumes table 27 bit positions are correct. The concern with this is the fact that  0xBE02 is used for self-test and does seem to work that way. On an email from AD support staff this week, “Valeria” says:

“3. Could you please perform the self-test function?  DIN = 0xBE02”

I tried this and it worked. If instead of doing a self-test it did a Power-down, as per our new table, then I would have noticed. No power down happened and it looked to me that  DIN = 0xBE02 does perform the self-test.

When I say others use it this way I am refereing to a topic on this forum:

“Arduino/ Esp8266 and ADIS16223 - SPI and wiring issue”.

The user “Sille” publishes his code and one line says:-

"write_reg(0xBE02)  --in case an error occures doing a self test"

I am sure that worked for him and that 0xBE02 did not perform a power-down as suggested by our new table.
On page 12 of the Data sheet it says:

“When data is extracted after a capture, the user can command the device to go back to sleep by setting GLOB_CMD[1] = 1 (DIN = 0xBE02).“

So there is a clear clash between Power down and self-test.

Our new table needs to look at “self-test” and “power down” and not only look at the DIN commands but also check the bit positions. I know you have already done this, but current use of 0xBE02 as self-test means we need to investigate in more depth.

Logic

The logic is taking the GLOB_CMD DINs that are mentioned in various places on the data sheet and finding the rule/logic that matches them to the bit positions. Your table above shows the logic between bit positions and DIN commands. The typos on the Data Sheet made it hard to find the rule / logic to match positions to DIN Commands. Your table does this well and makes it much easier for developers to follow.

GLOB_CMD[1] and GLOB_CMD[2] bits and DINs

The data sheets says “Set GLOB_CMD[2] = 1 (DIN = 0xBE02) to run an automatic self-test routine”. My observation was:

“The DIN should be 0xBE04 not 0xBE02 ?”

This was to fit in with table 27 and assumes table 27 bit positions are correct. The concern with this is the fact that  0xBE02 is used for self-test and does seem to work that way. On an email from AD support staff this week, “Valeria” says:

“3. Could you please perform the self-test function?  DIN = 0xBE02”

I tried this and it worked. If instead of doing a self-test it did a Power-down, as per our new table, then I would have noticed. No power down happened and it looked to me that  DIN = 0xBE02 does perform the self-test.

When I say others use it this way I am refereing to a topic on this forum:

“Arduino/ Esp8266 and ADIS16223 - SPI and wiring issue”.

The user “Sille” publishes his code and one line says:-

"write_reg(0xBE02)  --in case an error occures doing a self test"

I am sure that worked for him and that 0xBE02 did not perform a power-down as suggested by our new table.
On page 12 of the Data sheet it says:

“When data is extracted after a capture, the user can command the device to go back to sleep by setting GLOB_CMD[1] = 1 (DIN = 0xBE02).“

So there is a clear clash between Power down and self-test.

Our new table needs to look at “self-test” and “power down” and not only look at the DIN commands but also check the bit positions. I know you have already done this, but current use of 0xBE02 as self-test means we need to investigate in more depth.