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ADIS16488 Calibration


I am using an ADIS16488AMLZ IMU as a reference device for an IMU test/calibration system. I'd like to calibrate/verify the device, as it will be the basis for calibration of any devices under test. I'm not an expert in sensor technology, but my current understanding of calibration would be to subject the ADIS to a 'known' set of conditions and adjust the internal bias/scale offset registers to make the device 'agree' with the conditions I'm subjecting it to. My problem is how to create the known conditions without some golden unit or calibration standard. Maybe there is some other technique I'm not aware of?

I understand that the ADIS16488AMLZ is now obsolete, but if I upgrade to a suitable replacement device (which would presumably come calibrated out of the factory), would I face the same challenge after some time as its characteristics begin to drift? And would I need to consider in-system calibration (ie. to account for factors generated by my test fixture)?

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  • Thank you for the quick response. Is there some kind of calibration service offered by Analog Devices or through a 3rd party that could characterize/calibrate the device? Most of my industry experience has been in electrical and RF test/measurement, where we are required to simply send our instruments out to a certified calibration lab at regular intervals. I'm wondering if this type of model exist in the MEMs world as well?

    My issue is that I need to be able to trust that my device is meeting the performance defined in the spec sheet, or at least have a clear understanding of any performance degradation. With a device that is several years old and also obsolete, I need to either verify my current device or upgrade to a new device.

    Here is a bit of context to describe our use case:

    • Three-axis rotational fixture with mounting for reference IMU (ADIS16488) and DUT
    • Measuring linear acceleration in various static positions (without rotational movement)
    • Measuring angular velocity from 0 to 360 degrees per second on each axis
    • Operating temperature range from -30C to +55C
    • Storage temperature between +20C and +25C
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  • Thank you for the quick response. Is there some kind of calibration service offered by Analog Devices or through a 3rd party that could characterize/calibrate the device? Most of my industry experience has been in electrical and RF test/measurement, where we are required to simply send our instruments out to a certified calibration lab at regular intervals. I'm wondering if this type of model exist in the MEMs world as well?

    My issue is that I need to be able to trust that my device is meeting the performance defined in the spec sheet, or at least have a clear understanding of any performance degradation. With a device that is several years old and also obsolete, I need to either verify my current device or upgrade to a new device.

    Here is a bit of context to describe our use case:

    • Three-axis rotational fixture with mounting for reference IMU (ADIS16488) and DUT
    • Measuring linear acceleration in various static positions (without rotational movement)
    • Measuring angular velocity from 0 to 360 degrees per second on each axis
    • Operating temperature range from -30C to +55C
    • Storage temperature between +20C and +25C
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