We have been using the ADM238LJRZ in a "mature" product line with thousands of systems operating in the field. In some cases, the negative charge pump has been found to be damaged when cable lengths between devices are longer than approx 50 feet, which appears to have created conditions where wire capacitances exceed maximum allowable values. A detailed Failure Analysis confirmed that an EOS "event" had damaged the charge pump causing abnormally low output voltage. We are looking at implementing a TVS/Zener solution to mitigate this susceptibility but wonder if there might be a pin-to-pin alternative available that is inherently more robust than the ADM238L? As a side question, is there an established test method for this type of issue? One that could recreate the EOS damage and then be used to know that a TVS solution is working?