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ADN4680E Part-to-part Skew Repeatability

The ADN4680E M-LVDS transceiver has a fairly-large level of part-to-part skew, but the data sheet does not have a lot of detail on what factors contribute to this. Should I expect these shifts to be largely static, from manufacturing, and thus calibratable per-part during or before integration? Or is there some other origin that could change over a significant fraction of the listed 800 ps range post integration, as a result of component aging etc.?

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  • The primary contributor for part to part skew is the manufacturing variation in the silicon, and is fixed. It is not a drift vs time or device age. This part to part skew could be calibrated out at the system level during the end system manufacturing.  

    If this is useful for the calibration process, I can provide more detailed data re. the part to part skew and how it shifts between channels, vs temperature, etc, . My email is neil.quinn@analog.com

    Regards,

    Neil 

Reply
  • The primary contributor for part to part skew is the manufacturing variation in the silicon, and is fixed. It is not a drift vs time or device age. This part to part skew could be calibrated out at the system level during the end system manufacturing.  

    If this is useful for the calibration process, I can provide more detailed data re. the part to part skew and how it shifts between channels, vs temperature, etc, . My email is neil.quinn@analog.com

    Regards,

    Neil 

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