QIn an ESA-Study I evaluate different linear ICs, like the amp OP484 and the
comparator 139.The aim is to mitigate the radiation induced Single-Event
Transients (SET) in a circuit. Therefore I need some information’s about the
transients. Can You provide a rad-test report with some radiation induced SETs
and crossections ?
AAnalog Device has not performed any Single Event Effects (SEE) testing on the
PM139 or the OP484 devices.
Please find attached third party test data that we have available.
The following reports are copy right protected, so I am not able send a copy. A
copies are available from IEEE.
Reference for OP484:
 The Impact of Single Event Gate Rupture in Linear Devices - Gary K Lum,
Hughes O’Donnell, and Nicholas
Bouta. IEEE Transaction on Nuclear Science Vol 47, No 6, December 2000.
 Single Event Transients in Operational Amplifiers
J. George, R. Koga, S. Crain, P. Yu, The Aerospace Corporation El Segundo, CA