Hi
We are developing a system to rigorously test the AD5668, a crucial component in industrial control applications. Our primary objective is to thoroughly test and validate the device's performance against its datasheet specifications before proceeding with board assembly.
An evaluation board has been successfully developed and is currently functional. However, we are encountering challenges in accurately calculating the Integral Non-Linearity (INL) and Differential Non-Linearity (DNL) of the AD5668.
Could you please provide guidance on the established methods for calculating these critical parameters?
Thanks
Lokesha