Hello Analog Devices Support Team,
I am working with the AD7124 and I am observing a repeatable behavior when reconfiguring the ADC between two measurement modes. I would like to ask whether this behavior is expected for the AD7124 architecture and what the recommended mitigation is.
Measurement setup
- ADC: AD7124
- Reference: same reference for all measurements (no change during reconfiguration)
- Continuous operation
- No external input switching during the critical measurement (input is shorted to 0 mV)
Measurement modes
-
Mode A (primary mode)
- Continuous measurement of a very small DC signal (order of single mV)
- High sensitivity setup
- This mode runs for long periods and requires good offset stability
-
Mode B (secondary mode)
- Occasional, one‑shot measurement on different input pins
- Originally ~900 mV, but I verified that even a few mV produce the same effect
- After the measurement, the ADC is reconfigured back to Mode A
Observed behavior
After returning from Mode B back to Mode A:
- A temporary offset shift appears in Mode A, even when the input is shorted to 0 mV
- The offset shift:
- has a fast onset immediately after reconfiguration
- relaxes slowly over time (seconds)
- fully returns to the original value without intervention
- The behavior is independent of signal amplitude (same effect for 900 mV and 3 mV)
- Changing PGA settings does not eliminate the effect
- Enabling/disabling input buffers does not change the character of the offset transient
- Standard settling time after reconfiguration is already respected
- A soft reset is performed before each reconfiguration, but this does not prevent the transient
I have attached a plot showing the transient behavior at 0 mV input, where a distinct negative offset transient appears and then slowly returns to the nominal level. 
Preliminary conclusion
Based on testing, this looks like a temporary internal analog offset / bias drift caused by reconfiguration, rather than:
- input settling
- reference instability
- PGA saturation
- digital filter settling only
Questions
- Is this temporary offset transient after reconfiguration an expected behavior of the AD7124 due to its shared analog front‑end / bias architecture?
- Does the soft reset reset only the digital state, leaving internal analog offset/bias circuits unaffected?
- Is there a recommended sequence to minimize this effect when switching between channels or measurement modes (e.g. dummy channel, standby/power‑down, offset calibration, discarding samples)?
- Would you recommend using:
- a short dummy conversion on a grounded channel, or
- SYSTEM OFFSET CAL after returning to the sensitive measurement mode?
- Is there any application note or errata that discusses this behavior for AD7124 or similar Σ‑Δ ADCs?
Thank you in advance for your guidance.
Best regards,
Jan