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AD7124: Temporary offset transient after channel reconfiguration, fully recovering over time

Thread Summary

The user is experiencing a temporary offset shift in the AD7124 ADC when switching between a high-sensitivity DC measurement mode and a one-shot measurement mode. The shift occurs immediately after reconfiguration, relaxes over seconds, and fully returns to the original value. Despite using the latest silicon with a pre-charge buffer, the issue persists. The recommended mitigation is to perform a SYSTEM OFFSET CAL after returning to the sensitive measurement mode, and using a dummy grounded channel with the same gain as a stabilization step is also suggested.
AI Generated Content
Category: Hardware
Product Number: AD7124-4 , AD712

Hello Analog Devices Support Team,

I am working with the AD7124 and I am observing a repeatable behavior when reconfiguring the ADC between two measurement modes. I would like to ask whether this behavior is expected for the AD7124 architecture and what the recommended mitigation is.

Measurement setup

  • ADC: AD7124
  • Reference: same reference for all measurements (no change during reconfiguration)
  • Continuous operation
  • No external input switching during the critical measurement (input is shorted to 0 mV)

Measurement modes

  1. Mode A (primary mode)

    • Continuous measurement of a very small DC signal (order of single mV)
    • High sensitivity setup
    • This mode runs for long periods and requires good offset stability
  2. Mode B (secondary mode)

    • Occasional, one‑shot measurement on different input pins
    • Originally ~900 mV, but I verified that even a few mV produce the same effect
    • After the measurement, the ADC is reconfigured back to Mode A

Observed behavior

After returning from Mode B back to Mode A:

  • A temporary offset shift appears in Mode A, even when the input is shorted to 0 mV
  • The offset shift:
    • has a fast onset immediately after reconfiguration
    • relaxes slowly over time (seconds)
    • fully returns to the original value without intervention
  • The behavior is independent of signal amplitude (same effect for 900 mV and 3 mV)
  • Changing PGA settings does not eliminate the effect
  • Enabling/disabling input buffers does not change the character of the offset transient
  • Standard settling time after reconfiguration is already respected
  • A soft reset is performed before each reconfiguration, but this does not prevent the transient

I have attached a plot showing the transient behavior at 0 mV input, where a distinct negative offset transient appears and then slowly returns to the nominal level. 

Preliminary conclusion

Based on testing, this looks like a temporary internal analog offset / bias drift caused by reconfiguration, rather than:

  • input settling
  • reference instability
  • PGA saturation
  • digital filter settling only

Questions

  1. Is this temporary offset transient after reconfiguration an expected behavior of the AD7124 due to its shared analog front‑end / bias architecture?
  2. Does the soft reset reset only the digital state, leaving internal analog offset/bias circuits unaffected?
  3. Is there a recommended sequence to minimize this effect when switching between channels or measurement modes (e.g. dummy channel, standby/power‑down, offset calibration, discarding samples)?
  4. Would you recommend using:
    • a short dummy conversion on a grounded channel, or
    • SYSTEM OFFSET CAL after returning to the sensitive measurement mode?
  5. Is there any application note or errata that discusses this behavior for AD7124 or similar Σ‑Δ ADCs?

Thank you in advance for your guidance.

Best regards,


Jan

  • Hi  ,

    Could you please help look into this query?

    Thanks,
    Francis

  • Hi Jan,

    • Can you please confirm what AD7124 grade are you using? Please note that there is a PCN regarding the r-designed AD7124 silicon. 
      • The standard silicon, when used in multi-channel mode, does not settle within the allowed time when switching channels for gains of 1 when high output data rates are used in conjunction with large resistive loads. The B-grade silicon includes a pre-charge buffer which aids the settling and hence ensures that all conversions are fully settled within the allowed time.
      • The re-designed silicon for all parts includes a pre-charge buffer which ensures that the first conversion after switching channels is settled.
      • You may check this FAQ for further details: AD7124-4/8 Standard Silicon, B-grade, and W-grade - Documents - Precision ADCs - EngineerZone
    • Yes, the soft reset resets only the digital state, leaving internal analog offset/bias circuits unaffected
    • To ensure stable and repeatable offset performance, we recommend performing a calibration on the AD7124 after configuration, particularly when switching between measurement modes or channels. Calibration helps remove any residual offset introduced during reconfiguration and is the most reliable way to maintain accuracy in high‑sensitivity measurements.

    Thanks and regards

    Coco

  • on Apr 30, 2026 6:48 AM in reply to RAdante Contains AI Generated Content
    0

    Hi Coco,

    thank you for your explanation and for pointing out the PCN and silicon revisions.

    Unfortunately, I need to report that replacing the device with the latest re‑designed silicon (with the pre‑charge buffer) did not eliminate the observed behavior. The temporary offset transient after switching measurement modes is still present and has the same characteristics as before.

    To clarify the observations:

    • The transient appears even when the input is shorted to 0 mV
    • The offset shift:
      • occurs immediately after reconfiguration
      • relaxes slowly over time (seconds)
      • fully returns to the original offset value
    • The behavior is independent of signal amplitude
      (same effect for ~150 mV and only a ~ 0mV)
    • PGA settings and input buffer enable/disable do not change the character of the transient
    • Standard channel settling requirements are met
    • A soft reset is performed before reconfiguration, but as confirmed, this resets only the digital state

    Based on this, it appears that:

    • the pre‑charge buffer successfully ensures correct settling of the first conversion,
      but
    • it does not prevent a temporary internal analog offset / bias re‑equilibration after reconfiguration, which dominates high‑sensitivity DC measurements.

    At this point, we consider this behavior to be an architectural characteristic of AD7124 when switching modes/channels, rather than a silicon revision issue.

    Could you please confirm:

    1. Whether this kind of temporary offset drift after reconfiguration is expected behavior, even on re‑designed silicon?
    2. Whether SYSTEM OFFSET CAL after returning to the sensitive measurement mode is the recommended and officially supported mitigation?
    3. Whether using a "dummy grounded channel with the same gain" as a stabilization step is an acceptable workaround from AD’s perspective.
    4. If there is any internal application note, errata, or best‑practice guideline that addresses this use case explicitly.

    Thank you for your support and clarification.

    Best regards,
    Jan

  • Hi  

    Apologies for the delayed response and thank you for your patience. I’ve received several updates from Piotr based on your recent discussions, and I’d like to share the key points here for alignment.

    Based on your observations, the behavior you are seeing is consistent with the interaction between the ADC’s input multiplexer switching and the external RC input network. The fact that the transient disappears when the input is shorted directly at the ADC pins, and that removing the RC network eliminates the effect, indicates that the external impedance is a key contributor rather than the ADC alone.

    During multiplexed operation, the ADC input sampling can interact with higher source impedance (such as series resistors and filter capacitors), which may result in temporary offset transients as the input settles. This is generally expected behavior when the input network bandwidth is limited.

    In such cases, there is no strict universal limit for RC values, but lower source impedance is generally preferred since larger series resistance and capacitance increase the time constant and prolong settling. To maintain filtering while minimizing this effect, the RC time constant should be balanced with the available settling time—however, among the available approaches, using a buffer to isolate the ADC input is the most effective solution, particularly when higher source impedance cannot be avoided, as it significantly improves settling behavior while preserving the desired filtering performance. Additionally, as a best practice, configuring separate channels for each operating mode and using the ADC sequencer (rather than reprogramming the ADC for each conversion) can help reduce additional disturbances from register writes and improve overall settling behavior.

    Thanks and regards,

    Coco

  • Hi Coco,

    thank you for your explanation and support.

    We understand that the behavior is caused by the interaction between the ADC input and the external RC network.

    At this stage, we cannot modify the existing hardware, so we handle the effect in software by allowing sufficient settling time.

    For future hardware revisions, we will consider adding an input buffer as recommended.

    Best regards,
    Jan