I am working with the AD7124-8 in a 4-wire RTD measurement setup and need clarification on how internal and system calibration behave when using an external reference.
My Setup:
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AD7124-8 in full-power mode
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FS value = 200, SINC4 filter
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Bipolar mode, all input and reference buffers enabled
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External reference selected
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Gain = 8
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Excitation current = 250 µA
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4-wire RTD:
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Excitation on AIN0
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RTD connected between AIN2 (P) and AIN3 (N)
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Reference resistor (Rref) = 10 kΩ
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Lead resistor (Rheadroom) ≈ 400 Ω
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Using ratiometric calculations to derive resistance from ADC code.
Calibration Procedure I Used:
After an ADC reset, I configure the device as above and then perform:
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Internal zero-scale (offset) calibration
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Internal full-scale (gain) calibration
Both were executed according to the datasheet procedure.
My Questions:
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After performing internal gain and offset calibration, are the ADC conversion results available in the data register adjusted with the offset and gain calibration registers? Or do I need to apply any correction in my firmware?
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Is it valid to perform internal calibration while external reference is selected in the configuration register ?, or Do we need to perform internal calibration with internal reference configured ?
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Regarding system calibration:
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For system zero-scale and full-scale calibration, what should be applied to the AIN2/AIN3 analog inputs in this configuration?
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It is mentioned that full-scale input should be provided while performing system full-scale calibration. As we are using IOUT as external reference , do we need to consider this while feeding voltage for system calibration ?
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I want to ensure I am calibrating the AD7124-8 correctly for accurate RTD measurement. Any guidance or recommended best practices would be very helpful.