1. Do you have any radiation data on LTC1407A?
If not, do you have any data on LTC1407 or the die used for LTC1407A?
Looking for total ionizing dose (TID) and single event effects (SEE) test results (SEE test results might include single event latch-up, single event upset, etc)
2. Does the die inside LTC1407A use CMOS, bipolar, or BiCMOS technology?