Open Fault Detection method of MAX31856

I would like to ask about the Open Fault Detection method of the MAX31856. When we checked the Open Fault Detection operation using the MAX31856EVSYS, which is the evaluation board of the MAX31856, and the oscilloscope, it seemed to bias the voltage to T+ and T-. In addition, a potential difference of several tens of mV to several hundred mV was observed between the T- and BIAS pins. When open fault occurs, the voltage of T+ rises to around +3.3 V, and when a short circuit occurs, the voltage of T+ and T- rises to around 170 mV.

Could you explain the principle of this operation?
(I would like to evaluate MAX31856 by connecting it to a circuit simulating thermoelectric power, so I would like to confirm it.)

Sorry to trouble you, but please confirm.