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ADF4159 NEG_BLEED_EN 配置问题,以及DIGITAL_LOCK_DETECT检测不锁定

Thread Summary

The user is troubleshooting issues with a PLL configuration using a 50 MHz reference clock and a 24 GHz VCO. When R3_DB21 is enabled, the CP voltage is stable at 1.4V and the VCO output is stable at 24 GHz. Disabling R3_DB21 causes the CP voltage to fluctuate. The digital lock detect (LDP) is not working even when the CP voltage is stable and R3[7] is set to 1. The support engineer suggested checking the impact of negative bleed current and ensuring the LDP bit is set, but the issue persists.
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系统使用参考时钟50Mhz(REFin),反馈信号RFinA频率是1.5Ghz(24G进行16分频得到),控制外部的VCO(24Ghz)。环路滤波器是参考ADI模拟仿真设计。

问题一:R3_DB21使能和关闭对PLL影响为什么这么大?(R3_DB16 = 1)
1、寄存器R7~R0的配置如下:
0x7
0x6
0x800006
0x5
0x800005
0x84
0xc4
0x1630083
0x42c800a
0x1
0x32ee0000

此配置R3_DB21 为1,测量cp端电压为稳定的1.4V左右,频谱测VCO部分的输出为24Ghz,波动很小

2、修改寄存器配置,将R3_DB21 = 0,测到的cp端电压为1.39V但是一直波动

寄存器配置如下:

0x7
0x6
0x800006
0x5
0x800005
0x84
0xc4
0x1430083
0x42c800a
0x1
0x32ee0000

问题二,在测量cp电压稳定在1.4V左右,且VOC可以稳定输出24Ghz的时候,将MUXOUT配置为DIGITAL_LOCK_DETECT的时候始终是低电平,这个为啥检测不到锁定呢?

大家有没有遇到过类似的问题呢?希望一起交流下

谢谢!!

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