In my last several blogs I've been talking a lot about radiation testing. At the beginning of the series of blogs I've been posting we looked at the various types of radiation testing that are performed for products going into space applications. Recall that we looked at TID (Total Ionizing Dose) and SEE (Single Event Effects) testing where TID is a type of cumulative effect testing and SEE is more of a real time test. We spent a lot of time specifically looking at the various types of SEEs - Single Event Latchup (SEL), Single Event Upset (SEU), Single Event Transient (SET), and Single Event Functional Interrupt (SEFI). Upon going over the basics I applied that to the case of high speed ADCs and looked specifically at these single event effects are observed as well as how we look at TID with such devices. This month I am taking a step back and looking at the why instead of the what. Hop on over to Planet Analog and take a look at my latest blog: Why All This Stringent Testing?.
In my latest blog we look at the different sources of radiation as pictured above. The three sources are solar radiation, cosmic rays, and trapped radiation around the earth. Devices going into space have quite a harsh environment with all these sources of radiation as well as drastic temperature changes due to passing in and out of the path of the heat of the sun (satellite applications specifically). I hope you'll take a look and learn a little more about space. Feel free to leave a comment here or over on Planet Analog. I'd love to hear your feedback.
Also, if you are reading this today on 7/27/18 don't forget to check out the live streams of the lunar eclipse. It is not viewable in North America, but you can catch it from various feeds from Europe:
You can also find it on the Weather Channel app at 4:00PM EST.