Hi,
The AD5522 datasheet specifies a "combined leakage at DUT" of 15 nA to 25 nA (Rev. F, page 8). Based on the rows above this one, it appears that this value is "measured with ±11 V stress applied to pin, switch off".
Could you please clarify in more detail the test conditions used for this specification ?
I attempted to measure the leakage current by applying 10 V to the output of a channel while the channel was disabled. In this case, I measured a current of about 125 uA, which is far from the value specified in the datasheet.
My setup was as follows:
- AD5522 configured using the evaluation board and evaluation software
- Output voltage is 1 V and channel disabled
- Measurement repeated using direct SPI commands (same result)
- Current measured using a Keithley 2450 SMU connected to the "gold pins" labeled RDUT1 on the evaluation board schematic
I also repeated the measurement at 1 V, which resulted in a current of 2.8 uA. These currents change little with each channel or with the reference voltage (5V or 2.5V).
If the "combined leakage at DUT" specification (or the other leakage specifications above in the table) does not correspond to the leakage current when the channel is disabled, could you please clarify what this specification represents and, if available, provide the expected leakage current for a disabled channel ?
Best regards.
